【光电测试】光电性能测试办理流程光电性能测试方法【费用 周期 机构 报价】

光电性能测试办理流程
需求确认：明确测试对象（如LED、OLED、太阳能电池等）及目标参数（光通量、色坐标、电学特性等）。
选择实验室：优先选择具备CNAS/CMA资质的第三方检测机构（如质海检测、奇点检测）。
样品准备：提供3-6个完整样品（含包装及说明书），部分测试需标注额定功率、光通量等参数。
测试执行：实验室按标准流程进行，如积分球光谱测试、分布光度计测量等，周期通常1-2周。
报告获取：通过后出具中英文双语报告，支持电子/纸质版，有效期1年。
灯具安全电磁寿命检测 光电性能质检报告 第三方照明设备检测机构

光电性能测试方法
核心项目：
光通量：使用积分球+光谱辐射计系统（≥30cm直径），消除自吸收误差。
色度参数：依据CIE 1931标准，测量色坐标、显色指数（CRI≥80为合格）。
电学特性：源表四线法测正向电压（Vf），反向电流（Ir）需<10μA。
设备参考：
积分球光谱测试系统（如Ocean HDX）。
探针台设备（矽弼，5万元）支持晶圆/芯片测试。
太阳光模拟器（广皓天，3.67万元）用于温度冲击测试。
矽弼 探针台设备 光电器件测试 电流噪声性能稳定

三箱冷热冲击试验箱适用于光电设备在温度冲击下的光学性能测试

注意事项
测试前需预热设备30分钟以上，避免环境光干扰。
出口欧盟需同步符合EN 62717或CE认证。

Process for Handling Optoelectronic Performance Testing
Requirement confirmation: Clearly define the test objects (such as LED, OLED, solar cells, etc.) and target parameters (such as luminous flux, color coordinates, electrical characteristics, etc.).
Choose a laboratory: Priority should be given to third-party testing institutions with CNAS/CMA qualifications (such as Quality Sea Testing and Singularity Testing).
Sample preparation: Provide 3-6 complete samples (including packaging and instructions), and some tests need to indicate parameters such as rated power and luminous flux.
Test execution: The laboratory follows standard procedures, such as integrating sphere spectroscopy testing, distributed photometry measurement, etc., with a typical cycle of 1-2 weeks.
Report acquisition: After approval, a bilingual report in both Chinese and English will be issued, supporting electronic/paper versions, with a validity period of 1 year.
Lamp safety, electromagnetic life testing, photoelectric performance quality inspection report, third-party lighting equipment testing organization
Optoelectronic performance testing method
Core project:
Luminous flux: Use an integrating sphere+spectral radiometer system (≥ 30cm diameter) to eliminate self absorption errors.
Chromaticity parameters: According to the CIE 1931 standard, measure color coordinates and color rendering index (CRI ≥ 80 is qualified).
Electrical characteristics: The forward voltage (Vf) and reverse current (Ir) measured by the source meter four wire method should be less than 10 μ A.
Equipment reference:
Integral sphere spectroscopy testing system (such as Ocean HDF).
The probe station equipment (Silicon Bi, 50000 yuan) supports wafer/chip testing.
The solar simulator (Guanghao Tian, 36700 yuan) is used for temperature shock testing.
The current noise performance of the photoelectric device testing of the Si Bi probe station equipment is stable
The three box thermal shock test chamber is suitable for optical performance testing of optoelectronic equipment under temperature shock
Precautions
Preheat the equipment for at least 30 minutes before testing to avoid interference from ambient light.
Exporting to the EU requires simultaneous compliance with EN 62717 or CE certification.